IEEE

A Deep Learning-Based Surrogate Model for Locos Etch Process TCAD Simulation Using a Conditional Variational Autoencoder

Abstract: High-cost Technology Computer-Aided Design simulations create a significant bottleneck in semiconductor process development. We present a deep learning surrogate model, using a Conditional ...
Medical Device and Diagnostic Industry (MD+DI)

The AI Era: How Deep Learning is Overcoming Data Scarcity in Medical Imaging

AI medical imaging market is projected to exceed $20B by 2035. Generative models address class imbalances in medical imaging ...
IEEE

Behind-the-Meter PV Disaggregation with Copula-Constrained Bayesian Variational Autoencoder and Feature Clustering

Abstract: A quantitative assessment of the uncertainty of behind-the-meter (BTM) PVs is critical for accurate forecasts, voltage control, and distribution system security. This paper proposes a novel ...