A software workflow automates X-ray analysis to spot crystal defects in diamond and advanced semiconductors, helping improve ...
Abstract: Recent advances in large multimodal models (LMMs) demonstrated remarkable capabilities in handling complex multimodal tasks. However, The applications of LMMs to railway defect detection ...
Abstract: Surface defects in Printed Circuit Boards (PCBs), which arise during manufacturing, significantly impact product quality and directly influence equipment performance, stability and ...
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